FYSS5456 Helium Ion Microscopy (1 cr)

Grading scale
Pass-fail
Teaching languages
Finnish , English

Learning outcomes

At the end of this course, students will be able to describe the working principle of helium ion microscopy (HIM) and conclude the advantages and disadvantages of HIM compared to other microscopy techniques. Students will be able to evaluate and justify the application of HIM to imaging of specific samples, such as biological samples and materials science and nanotechnology samples. They will have mastered the HIM principles and practice of tuning and using HIM for imaging to such extent that he/she can be trained to the use of the tool in a short time period.

Study methods

Discussions and interactive events, demonstration, examination.

Content

The working principle of HIM; advantages of HIM compared to conventional SEM (resolution, ability to image non-conductive samples, material processing with neon beam); practical use of HIM; sample preparation of HIM.

Further information

Given on autumn 2017, after which given when needed.

Literature:

ISBN-number Author, year of publication, title, publisher
978-1-4614-8659-6 David C. Joy, Helium Ion Microscopy 鈥� Principles and Applications, ISBN 978-1-4614-8659-6.

Assessment criteria

Participation on course events and demonstration is a requirement for grading. To pass the course students need to have a pass from the examination.